Materials Characterization & Imaging
Abstracts due - January 24
Technical Staff Member & Director, Characterization Facility (CharFac)University of Minnesota
Technical Program ChairTechConnect World Innovation Conference
This year's symposium will focus on innovations in nanoscale materials characterization including new method development as well as industry-specific applications. Submissions are also invited for special sessions focused on machine learning for materials characterization and imaging (in conjunction with the AI TechConnect Conference); and on industrial applications of x-ray scattering methods.
Topics & Application Areas
- Innovations in Nanomaterials Characterization
- Special Session: Machine Learning for Materials Characterization and Imaging
- Special Session: Scattering Methods in Industrial Applications
View the 2019 program »
Submit Your Abstract
Please first review the information for authors — abstract submission guidelines.