Virtual Failure Analysis of Electronic Components based on Accelerated Reliability Tests
Ariel University R&D Co., Israel, Israel
New method for determining reliability vs. performance for electronic components, able to separately analyze different failure mechanisms. Based on accelerated lifetime tests, we are able to monitor both the characteristic of a failure as well as the device performance degradation. Devices can then be optimized for particular performance/reliability tradeoff.
Primary Application Area: Electronics, Sensors & Communications
Technology Development Status: Proven Manufacturability
Technology Readiness Level: TRL 6
FIGURES OF MERIT
Value Proposition: New method for determining reliability vs. performance for electronic components, able to separately analyze different failure mechanisms. It allows accurate prediction of performance vs. reliability in actual circutis. It is expected that in the near future, this method may be adopted by DOD as military standard.
Organization Type: Academic/Gov Lab
GOVT/EXTERNAL FUNDING SOURCES
Government Funding/Support to Date: Supported by Israel office of Chief Scientist, received $100,000 funding to develop test method in conjuction with local Israeli company
Primary Sources of Funding: Corporate Partner, Federal Grant
Looking for: Development / License Partners