TechConnect World 2018

Materials Characterization & Imaging

Nanoscale Materials Characterization

Posters Due: March 30, 2018 (poster consideration only)

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Greg  HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
SurfaceChar LLC

Key Speakers

Sung ParkPhoto-induced force microscopy: a technique for hyperspectral nanochemical mapping
Sung Park
CEO, Molecular Vista

James GimzewskiJames Gimzewski
Professor, Director Nano & Pico Characterization Lab
University of California, Los Angeles

Kevin KjollerKevin Kjoller
Vice President
Anasys Instruments

Thuc-Quyen  NguyenNanoscale Characterization of Solar Cells by Conductive and Photoconductive Atomic Force Microscopy
Thuc-Quyen Nguyen
Professor, Department of Chemistry and Biochemistry, University of California, Santa Barbara

Symposium Sessions

Wednesday May 16

8:30Characterizing Soft/Bio Materials
10:30Materials Characterization & Imaging I
1:30Materials Characterization & Imaging II
4:00Materials Characterization & Imaging: Posters

Symposium Program

Wednesday May 16

8:30Characterizing Soft/Bio Materials
8:30TBA (invited presentation)
J. Gimzewski, University of California, Los Angeles, US
8:55The developments of a Helium Acoustic Levitation Environment for time resolved XFEL experiments
E.R. Dye, R.H. Morris, M.I. Newton, D. Axford, P. Aller, A.M. Orville, P.T. Docker, Nottingham Trent University, UK
9:15Abrasive scanning with AFM on biocompatible polymers: measuring dry vs. swollen film thickness and probing properties
G. Haugstad, K. Wormuth, University of Minnesota, US
9:35Nano-JKR Method Eliminates Adhesion Errors in Nanoindentation of Compliant Polymers and Hydrogels
D.M. Ebenstein, Bucknell University, US
9:55Thorough Characterization of Liposomes by Complementary Light and X-Ray Scattering Techniques
R. Ragheb, J. Bolze, G. Taylor, N. Tamaddoni, D. Griffiths, U. Nobbmann, Malvern Panalytical, US
10:30Materials Characterization & Imaging I
10:30Chemical, Mechanical and Optical Property Mapping at the Nanoscale (invited presentation)
K. Kjoller, E. Dillon, Q. Hu, A. Roy, H. Yang, C. Prater, Ansys Instruments, US
10:55Photo-induced force microscopy: a technique for hyperspectral nanochemical mapping (invited presentation)
S. Park, D. Nowak, T. Albrecht, Molecular Vista, US
11:20In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force microscope
S. Xu, Keysight Technologies, US
11:40Alignment-free Plasmonic Nanowire Optical Probe for Tip-enhanced Raman Spectroscopy (invited presentation)
S. Kim, Y. Zhu, X. Ma, R. Yan, University of California, Riverside, US
1:30Materials Characterization & Imaging II
1:30Nanoscale Characterization of Solar Cells by Conductive and Photoconductive Atomic Force Microscopy (invited presentation)
T-Q. Nguyen, University of California, Santa Barbara, US
1:55Quantitative measurement of active dopant density distribution in textured emitter of phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy
K. Hirose, K. Tanahashi, H. Takato, Y. Cho, Tohoku University, JP
2:15Effect of filler size in a graphene-anthracene carbon-carbon composite
M. Singh, R. Vander Wal, Pennsylvania State University, US
2:35Modeling Cold Field-Assisted Electron Emission from Nanometric Metallic Electron Guns: Application to the Resolution of the Near Field Emission Scanning Electron Microscope
A. Chatziafratis, G. Fikioris, J. Xanthakis, National Technical University of Athens, GR
2:55Spectroscopic Diagnostics And Material Characterization For Wave Liquefaction™ Processing Of Carbon Materials For The Production Of Value-Added Chemicals And Feedstocks
R. Vander Wal, A. Sengupta, E. Musselman, K. Zeller, G. Skoptsov, Penn State University, US
4:00Materials Characterization & Imaging: Posters
Magnetometry Measurements of Nanomagnetic Materials
B.C. Dodrill, Lake Shore Cryotronics, US
Characterization of Polymer Nanocomposites with Thermal Analysis and Spectrum techniques
M.E. Mena Navarro, R.F. Estrada Guerrero, L.A. Torres González, R. Tinajero, L. Palafox, Universidad Iberoamericana Ciudad de Mexico, MX
Colloidal Quantum dots synthesis and their biosensors applications
S. Jain, ASU, US
Acid Electrolytes Effect on In-Situ Growth and Morphology of Polymer Nanowires in Microelectrode Devices
M. Mushfiq, M.M. Alam, InnoSense LLC, US
Effects of Ca doping on Grain and Grain Boundary Properties of ZnO-Zn2BiVO6-Co3O4 Ceramics using Dielectric Functions for Surge Arrestor
Y.W. Hong, M.J. Ha, J.H. Paik, J.H. Cho, Y.H. Jeong, J.S. Yun, W.I. Park, Korea Institute of Ceramic Engineering & Technology, KR
Microstructural Properties of ZnO Powder Nanostructures Prepared by Mechanical Alloying
Liquid-Metal-Jet and High-Resolution X-Ray Source Technology for Imaging
J. Hallstedt, A. Adibhatla, B. Hansson, O. Hemberg, G. Johansson, M. Otendal, P. Takman, T. Tuohimaa, Exillum Inc, US

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

Submit Your Abstract

Please first review the information for authors — abstract submission guidelines.


Topics & Application Areas

  • Composites Characterization: From Nano to Micron Scale
  • Near-Surface Characterization & Functionalization:  Thin Films & Coatings, Soft Matter Photovoltaics, Dewetting, Adhesion, Tribology
  • Mesoporous Materials & Catalysts for Energy Applications
  • Morphology in Polymer-Based Technologies: Crystallization, Phase Segregation, Thermal Behavior, Gelation, Networks
  • Correlative Techniques and In-Situ Characterization
  • Advances in Instrumentation
  • Other

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