L. Glickman, R. Surikuchi, G. Kim
Community College of Philadelphia,
United States
Keywords: characterization, graphene, transistors
Summary:
The focus of this project was the fabrication and characterization of graphene transistors on 280 nm SiO₂ wafers. This was achieved by utilizing different nanofabrication and characterization techniques. This project shines a spotlight on one of the many emerging applications of graphene in nanoscale electronics