H.L. Lechuga, E. Imbertson, C.K. Spicer
3M Company,
United States
Keywords: atomic force microscopy, AFM, AFM-IR, tapping mode AFM-IR, tapping AFM-IR, SPM
Summary:
At 3M’s Corporate Research Analytical Laboratory (CRAL), AFM-IR has become a standard tool for characterizing the chemistry, at the submicron level, of 3M materials in various sample constructs. This technique proved to be an invaluable addition to 3M CRAL’s AFM capabilities impacting many important product platforms. The more recent implementation of tapping mode AFM-IR, a surface-sensitive configuration, is a crucial development since it has significantly expanded the application of AFM-IR to a wider set of 3M materials. This talk will provide examples of AFM-IR applications enabled by tapping mode AFM-IR from an industrial setting perspective.