X. Xu
Stony Brook University,
United States
Keywords: peak force tapping, AFM-IR, PFIR, 2DIR, KPFM, Kelvin probe force microscopy, nano-IR
Summary:
In this presentation, I will discuss the development of nanoscale infrared microscopy based on the peak force tapping mode of AFM for chemical imaging and spectroscopy. I will also present the development of pulsed force Kelvin probe force microscopy as a non-conventional Kelvin probe force microscopy under ambient conditions.