J.D. Adams, H. Gunstheimer, P. Markus, B. Hoogenboom
Nanosurf AG,
Switzerland
Keywords: high-speed imaging, nanomechanical characterization, photothermal actuation
Summary:
Virtually all implementations of the atomic force microscope (AFM) include a way to modulate the distance between the cantilever probe and the sample surface. For AFM-based nanomechanical analysis in particular, the probe is brought in and out of sample interaction with a cyclic distance modulation. Measurement speeds are often limited by the rate at which this modulation may be performed. Historically, this modulation has been performed by moving the z-scanner, a macroscopic object [1]. However, a significant benefit can be realized by moving the smallest and least massive object possible – in this case, the cantilever probe. Out of many different approaches, photothermal actuation has emerged as one of the easiest and most flexible methods with which to directly actuate AFM cantilevers. In this presentation, we will cover some of the ways in which photothermal actuation may improve AFM operation, with particular focus on methods combining high-speed and broad-frequency-range topographical [2] and mechanical sample characterization [3]. [1] A. Rosa-Zeiser et al., Meas. Sci. Technol. 8, 1333–1338 (1997) [2] A.P. Nievergelt et al., Nat. Nanotech. 13, 696–701 (2018) [3] H. Gunstheimer et al., Small 21, e07640 (2025)