P Malik, R. Padhan, S. Dixit, R. R. Srivastava, M. Susner, R. Rao, A.V. Sumant, N.R. Pradhan
Jackson State University,
United States
Keywords: ferroelectricity, 2D materials, CuCrP₂S₆, vector PFM
Summary:
The study of ferroelectricity in two-dimensional (2D) materials is crucial for the development of next-generation nanoelectronic devices. CuCrP2S6, a layered van der Waals material, exhibits promising ferroelectric properties that are strongly influenced by its thickness.[1,2] This work explores how ferroelectric behavior in CuCrP2S6 varies as the material is thinned down to few-layer scales using vector Piezoresponse Force Microscopy (PFM). Vector PFM enables detailed mapping of polarization components, revealing domain structures and their evolution with thickness reduction. Our results demonstrate a clear thickness dependence of ferroelectric signals, indicating changes in polarization stability and domain configuration from bulk to ultrathin flakes. These findings provide insights into the fundamental ferroelectric mechanisms at the 2D limit and suggest potential avenues for tuning ferroelectric properties through thickness engineering. Understanding such thickness-dependent ferroelectricity in CuCrP2S6 paves the way for its application in flexible, miniaturized electronic components.