Materials Characterization & Imaging

JUNE 9-11, 2025 | AUSTIN, TX
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Materials Characterization
& Imaging

This year's symposium will focus on innovations in nanoscale materials characterization including new method development as well as industry-specific applications. Submissions are also invited for special sessions focused on machine learning for materials characterization and imaging (in conjunction with the AI TechConnect Conference); and on industrial applications of x-ray scattering methods.

Topics & Application Areas

User facilities for industrial participation
Advances in image analysis
Characterization of real-world systems
Machine learning for Characterization
Other

Symposium Co-Chairs

Greg Haugstad

Technical Staff Member & Director, Characterization Facility (CharFac)

University of Minnesota

Dalia Yablon

Technical Program Chair

TechConnect World Innovation Conference

Alex Norman

Executive Director

Princeton Materials Institute, Princeton University

Back to Top ↑ Symposium Sessions
	Monday June 9
10:30	Materials Characterization and Imaging

Symposium Program
	Monday June 9

10:30	Materials Characterization and Imaging	Room 307
	Session chair: Greg Haugstad, University of Minnesota, US
	Multiscale Characterization of PEEK with Atomic Force Microscope: 3D Printing Applications M. Adamson, B. Blake, B. Eslami, Widener University, US
	Fatigue and Fatigue Damage Mechanisms in High-Temperature Thermoplastic Composites R. Sheley, J.S. Tate, M. Tehrani, Texas State University, US
	Novel synthesis route of superconducting polycrystalline SmFeAsO1-xFx with Tc = 56 K Y. Kamihara, Y. Kobayashi, R. Takeuchi, M. Matoba, Keio University, JP
	Compact neutron instruments for non-destructive testing and imaging applications in the lab or field-deployed J.T. Cremer, Adelphi Technology, Inc., US