Materials Characterization & Imaging

JUNE 9-11, 2025 | AUSTIN, TX
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Materials Characterization
& Imaging

This year's symposium will focus on innovations in nanoscale materials characterization including new method development as well as industry-specific applications. Submissions are also invited for special sessions focused on machine learning for materials characterization and imaging (in conjunction with the AI TechConnect Conference); and on industrial applications of x-ray scattering methods.

Submit your Abstract - due April 4

Please first review the information for authors — abstract submission guidelines.

Topics & Application Areas

User facilities for industrial participation
Advances in image analysis
Characterization of real-world systems
Machine learning for Characterization
Other

Symposium Co-Chairs

Greg Haugstad

Technical Staff Member & Director, Characterization Facility (CharFac)

University of Minnesota

Dalia Yablon

Technical Program Chair

TechConnect World Innovation Conference

Alex Norman

Executive Director

Princeton Materials Institute, Princeton University

Back to Top ↑ Symposium Sessions
	Monday June 9
10:30	Materials Characterization and Imaging
4:00	Materials Characterization & Imaging - Posters

Symposium Program
	Monday June 9

10:30	Materials Characterization and Imaging
	Session chair: Greg Haugstad, University of Minnesota, US
	Multiscale Characterization of PEEK with Atomic Force Microscope: 3D Printing Applications M. Adamson, B. Blake, B. Eslami, Widener University, US
	Fatigue and Fatigue Damage Mechanisms in High-Temperature Thermoplastic Composites R. Sheley, J.S. Tate, M. Tehrani, Texas State University, US
	Assessing Electronics with Advanced 3D X-ray Imaging, Nanoscale Tomography, and Deep Learning H. Villarraga-Gómez, ZEISS, US
	Combining Simulation and Small Angle Neutron Scattering at SNS and HFIR Y. Shang, Oak Ridge National Laboratory, US
	Novel synthesis route of superconducting polycrystalline SmFeAsO1-xFx with Tc = 56 K Y. Kamihara, Y. Kobayashi, R. Takeuchi, M. Matoba, Keio University, JP

4:00	Materials Characterization & Imaging - Posters
	Dielectric properties of Fe substituted MgFexCr2-xO4 chromites S. Agrawal, NIT RAIPUR, IN
	Compact neutron instruments for non-destructive testing and imaging applications in the lab or field-deployed J.T. Cremer, Adelphi Technology, Inc., US
	Synthesis of Nanostructured MOF UiO66-F4 in O/W and Bicontinuous Microemulsions E.Y. Ugalde Salas, M.J. Quijano Arteaga1, M.E. Navarro Segura, A. Concha Balderrama, N. Pineda Aguilar, M. Sánchez Domínguez1, CIMAV, MX
	Material Stability and Durability Testing in Low Earth Orbit Outside the ISS P.H. Irace, R.D. Reeves, M.S. Roberts, International Space Station National Lab, US