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| Monday June 17 |
| 10:30 | SPMConnect: Novel uses of Cantilever Dynamics |
| 1:30 | SPMConnect: Electrical Modes I (Electrostatics & Conductive) |
| 3:30 | SPMConnect: Panel Discussion - SPM for Semiconductors |
| Tuesday June 18 |
| 9:00 | SPMConnect: Advances FluidFM |
| 11:00 | SPMConnect: Dynamic Processes at Solid-Liquid Interfaces |
| 1:30 | SPM Nanomechanics |
| 3:30 | SPM Cantilevers |
| 3:45 | Panel Discussion - SPM Cantilevers |
| Wednesday June 19 |
| 9:00 | SPMConnect: Chemical Spectroscopy |
| 10:00 | Scanning Probe Microscopy of 2D Materials |
| 1:30 | SPMConnect: SPM of Cells, Biomolecules & Biomaterials |
| 3:00 | SPMConnect: Electrical modes II (Electromechanics) |
|
2024 Symposium Program |
| Monday June 17 |
|
| 10:30 | SPMConnect: Novel uses of Cantilever Dynamics | National Harbor 5 |
| Session chair: James De Yoreo, Pacific Northwest National Laboratory, US |
| AFM cantilever structure revisited – improving AFM imaging speed through unconventional cantilever design
G.E. Fantner, N. Hosseini, M. Neuenschwander, P. Swain, M. Penedo, EPFL, CH |
| Harnessing torsional resonances for enhanced atomic force microscopy
B. Pittenger, M. Ye, S. Hu, J. Thornton, P. De Wolf, Bruker Corporation, US |
| AFM cantilever, contact mechanics, and electrostatics calibration in the off-resonant dynamic regime
S. Raghuraman, N. Domingo, S. Jesse, Oak Ridge National Laboratory, US |
|
| 1:30 | SPMConnect: Electrical Modes I (Electrostatics & Conductive) | National Harbor 5 |
| Session chair: Mihir Pendharkar, Stanford University, US |
| Atomic-Resolution Surface Imaging under Ambient Conditions via Conductive Atomic Force Microscopy
M.Z. Baykara, University of California, Merced, US |
| Tracking charge dynamics by high speed and time resolved Kelvin Probe Force Microscopy
S. Jesse, Oak Ridge National Laboratory, US |
| Measuring Microsecond Dynamics in Photovoltaics with Time-Resolved Electrostatic Force Microscopy
R. Giridharagopal, M.D. Breshears, J. Pothoof, D.S. Ginger, University of Washington, US |
| Spatially resolved random telegraph noise
P. Grutter, McGill University, CA |
| Optimized Cantilevers for Highly Sensitive and Spatially Resolved Measurements of Magnetic, Electric, and Dielectric Properties in Lift-Mode operated AFM Techniques
P. De Wolf, R. Poddar, K. Kaja, B. Pittenger, S. Hu, Bruker, US |
|
| 3:30 | SPMConnect: Panel Discussion - SPM for Semiconductors | National Harbor 5 |
| Session chair: Jason Killgore, NIST, US |
| Panelist
G. Min, Park Instruments, US |
| Panelist
D. Ziegler, Nanosurf, US |
| Panelist
K. Amponsah, Xallent Inc., US |
| Tuesday June 18 |
|
| 9:00 | SPMConnect: Advances FluidFM | National Harbor 5 |
| Session chair: Simona Patange, NIST, US |
| FluidFM: Cytosurge's journey from hollow AFM probes to precision genome engineering
P. Behr, Cytosurge AG, CH |
| FluidFM in Live Cell Biology: From Biomechanics to Single-Cell Omics
O. Guillaume-Gentil, EPFL, CH |
| Advancements in BioAFM: Fluid Micro Cantilevers and Novel Thermocouple Devices for Cellular Analysis
A. Gaitas, Icahn School of Medicine at Mt. Sinai, US |
| Capturing Transient Responses – Combining BioAFM with External Stimulation
A. Gelmi, RMIT University, AU |
| Scanning Probe Microscopy Based Investigations at Single Cell Level
G-Y. Liu, University of California, Davis, US |
|
| 11:00 | SPMConnect: Dynamic Processes at Solid-Liquid Interfaces | National Harbor 5 |
| Session chair: Christina Newcomb, Stanford University, US |
| An in situ look at interfacial structure and dynamics during nucleation and self-assembly
J.J. De Yoreo, Pacific Northwest National Laboratory, US |
| Scanning Probe Microscopy Investigations of Microbiologically Influenced Corrosion on Naval Assets
T.T. Brown, J.S. Lee, U.S. Naval Research Laboratory, US |
| The role of additives on the thermodynamics and kinetics of nucleation, crystal growth and dissolution
J. Tao, Pacific Northwest National Laboratory, US |
|
| 1:30 | SPM Nanomechanics | National Harbor 5 |
| Session chair: Jason Killgore, NIST, US |
| Nanomechanical analysis of materials using photothermal off-resonance actuation
E. Nelson, J.D. Adams, H. Gunstheimer, G. Fläschner, B. Hoogenboom, Nanosurf AG, CH |
| Broadband, High Frequency Viscoelastic Property Characterization of Polymers with Atomic Force Microscopy
A. Deolia, S.P. Carter, R.B. Wagner, Purdue University, US |
| Mechano-Spectroscopy of Soft Materials with Atomic Force Microscopy: Comparison with Raman Confocal Microscopy
N. Kulachenkov, M. Petrov, I. Sokolov, Tufts University, US |
| Pushing AFM to the boundaries — Validating mechanical property measurement near a rigid substrate
R.J. Sheridan, I. Saito, L.C. Brinson, Duke University, US |
| Advancing Nanobiomechanical Research: Large Tissue Area Mapping and Nano Scale Rheology via AFM
M. Ye, A. Koernig, Bruker Nano Surface, US |
| Exploring Biomechanical Properties of Microporous Annealed Particle Hydrogel (MAP Gel) in Comparison with MAP-treated Natural Tissues
M. Motezaker, J.J. Daniero, P.E. Hopkins, University of Virginia, US |
|
| 3:30 | SPM Cantilevers | National Harbor 5 |
| Session chair: Christina Newcomb, Stanford University, US |
|
| 3:45 | Panel Discussion - SPM Cantilevers | National Harbor 5 |
| Session chair: Christina Newcomb, Stanford University, US |
| Panelist
O. Krause, NanoWorld AG, CH |
| Panelist
S. Jesse, Oak Ridge National Laboratory, US |
| Panelist
A. Eskandarian, Harvard Medical School, US |
| Wednesday June 19 |
|
| 9:00 | SPMConnect: Chemical Spectroscopy | National Harbor 5 |
| Session chair: Greg Haugstad, University of Minnesota, US |
| AFM-IR technique development in applications to industrial research
G. Haugstad, B. Luo, B. Curtin, K. Wormuth, University of Minnesota, US |
| Cross-correlated SPM and TERS/TEPL imaging: unique tool for nanoscale structural characterization of 2D semiconductors and the vertical / lateral heterostructures thereof.
A. Krayev, HORIBA Scientific, US |
| Optimized Spatial Resolution, Sensitivity, Measurement Speed and Artifact Reduction in Photothermal AFM-IR
C. Phillips, M. Wagner, Q. Hu, C. Li, P. Dewolf, Bruker Nano, US |
|
| 10:00 | Scanning Probe Microscopy of 2D Materials | National Harbor 5 |
| Session chair: Greg Haugstad, University of Minnesota, US |
| Torsional Force Microscopy of Van der Waals Moires and Atomic Lattices
M. Pendharkar, Stanford University, US |
| Scanning probe microscopy as a tool to uncover new phenomena in twisted 2D materials
A. Luican-Mayer, University of Ottawa, CA |
| The challenge of automating and summarizing analysis of particles in multiple AFM datasets
M. Cognard, Digital Surf, FR |
| Exfoliation of Nanoribbons from Bulk van der Waals Crystals for Optical and Electronic Characterization
A.P. Saunders, A. Krayev, V. Chen, A.C. Johnson, A.S. McKeown-Green, H.J. Zeng, E. Pop, F. Liu, Stanford University, US |
| Mechanical, electrical and KPFM investigations of ultrathin membranes of MoSSe alloy
J. Serafińczuk, A. Piejko, M. Tamulewicz-Szwajkowska, K. Król , R. Kudrawiec, Wroclaw University of Science and Technology, PL |
|
| 1:30 | SPMConnect: SPM of Cells, Biomolecules & Biomaterials | National Harbor 5 |
| Session chair: Simona Patange, NIST, US |
| Revealing a « New Microbiology » using Long-Term Time-Lapse Atomic Force Microscopy
H.A. Eskandarian, Harvard Medical School, US |
| Discovery of a fundamental class of solid matter with the atomic force microscope
O. Sahin, Columbia University, US |
| Single molecule analysis of nucleosomes by high-speed atomic force microscopy
D.P. Melters, K.C. Neuman, Y. Dalal, National Institutes of Health, US |
| Program biopolymer-van der Waals interfaces
S. Zhang, W. Zhou, J. Chen, B. Harris, M. Baer, C.L. Chen, J. DeYoreo, Pacific Northwest National Laboratory, US |
|
| 3:00 | SPMConnect: Electrical modes II (Electromechanics) | National Harbor 5 |
| Session chair: Peter Grutter, McGill University, CA |
| Resolving the impact of microstructure on optoelectronic properties via correlative atomic force microscopy
I. Hermes, Leibniz Institute of Polymer Research, DE |
| Improved AFM Measurement Accuracy and Precision Using Quadrature Phase Differential Interferometry for Tip Displacement Sensing
R. Proksch, A. Labuda, J. Lefever, J. Li, F.T. Limpoco, B. Ohler, Oxford Instruments Asylum Research Inc., US |
| Numerical modeling for piezo force microscopy measurements
G. Stan, National Institute of Standards and Technology, US |
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