JUNE 19-21, 2023
WASHINGTON, DC


SPMCOnnect

SPMConnect

Bruker
SPMConnect Sponsor

Symposium Co-Chairs

Liam CollinsLiam Collins
Staff Scientist
Oak Ridge National Laboratory

Jason KillgoreJason Killgore
Project Leader
National Institute of Standards and Technology

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Key Speakers

Paul AshbyFaster and gentler: new scan algorithms and probes for AFM
Paul Ashby
Staff Scientist, Lawrence Berkeley National Laboratory

Nina BalkeIn situ and Operando Force-based Atomic Force Microscopy For Probing Local Functionality in Energy Storage Materials
Nina Balke
Associate Professor, North Carolina State University

Alex Cartagena-RiveraMultiplexed nanoscale viscoelastic mapping of melanoma cells as a biomarker of tumor progression and metastasis
Alex Cartagena-Rivera
Investigator, National Institutes of Health

Peter GrütterSingle electron spectroscopy and ultrafast time resolution by AFM
Peter Grütter
Professor, McGill University

Ryan WagnerThe effects of beam dynamics on Atomic Force Microscopy measurements
Ryan Wagner
Assistant Professor, Purdue University

Laurene TetardExploiting infrared light-matter interactions to explore complex systems at the nanoscale
Laurene Tetard
Associate Professor, University of Central Florida

Filippo MangoliniIn Situ Study of the Pressure-Dependent Lubrication Mechanism of Phosphonium Phosphate Ionic Liquid in Nanoscale Single-Asperity Sliding Contacts
Filippo Mangolini
Assistant Professor, University of Texas, Austin

Josh AgarReal-Time Physics-Constrained Machine Learning in Multidimensional Atomic Force Microscopy
Josh Agar
Assistant Professor, Drexel University

Bahram RajabifarA deep learning content-based image retrieval tool for AFM topography maps
Bahram Rajabifar
Senior Research Scientist, 3M

Ryan TungContact Resonance AFM using Long, Massive, Flexible Tips
Ryan Tung
Associate Professor, University of Nevada Reno

Rama VasudevanRama Vasudevan
Group Leader
Oak Ridge National Laboratory

Simona PatangeEvaluation of FluidFM for genome editing in single cells
Simona Patange
Biologist, National Institute of Standards and Technology


Special Session: SPM Shared User Facilities

Alan SchwartzmanManaging an SPM Shared User Facility at MIT
Alan Schwartzman
Research Scientist, Massachusetts Institute of Technology

Christina NewcombChristina Newcomb
SPM Lab Manager
Stanford University

Jason TresbackJason Tresback
Staff Scientist
Harvard University


About SPMConnect

SPMConnect is launching at TechConnect 2023 as an annual AFM-based conference to foster and support the AFM community in terms of idea exchange, best practices development, mentoring, and career development. In addition to research talks, in line with the industrial/innovation theme of the broader TCW meeting, SPMConnect will feature panel discussions and plenty of opportunities for AFM researchers and scientists to meet, network and exchange ideas.

This conference aims to bring together users from a wide variety of disciplines including polymer science, biology, energy, computing, materials science, and more who share an interest in SPM as an instrument to explore nanoscale phenomena and characterization. SPMConnect aims to include scientists and researchers from a wide variety of backgrounds including industry, instrumentation vendors, academia, and national labs. Technical abstracts for both oral and poster presentation are welcomed with topics for 2023 SPMConnect listed below.

 
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2023 Symposium Sessions

9:00SPM: Dynamic Processes at Solid-liquid Interfaces
10:40SPM: Dynamic AFM
1:30SPM: Machine Learning & Automation
3:00SPM User Facilities Leadership Panel

Tuesday June 20

10:30SPM Based Chemical Spectroscopy
1:30SPM in Biology & Medicine

Wednesday June 21

9:00SPM: Nanomechanics & Tribology
1:30SPM: Voltage Modulated SPM Modes

2023 Symposium Program

Monday June 19

9:00SPM: Dynamic Processes at Solid-liquid InterfacesNational Harbor 4
Session chair: Liam Collins, Oak Ridge National Laboratory, US
9:00In situ and Operando Force-based Atomic Force Microscopy For Probing Local Functionality in Energy Storage Materials
N. Balke, North Carolina State University, US
9:25Scanning Electrochemical Probe Microscopy Reveals Tunable Angle-dependent Electrochemistry at Twisted Bilayer Graphene
Y. Yu, K. Zhang, D. Kwabena Bediako, George Mason University, US
9:45Mapping electrical double layer structure over nanostructured surfaces with three-dimensional atomic force microscopy.
B.A. Legg, M. Zhang, J. Heo, E. Nakouzi, J.J. De Yoreo, Pacific Northwest National Laboratory, US
10:05Faster and gentler: new scan algorithms and probes for AFM
P. Ashby, Lawrence Berkeley National Laboratory, US
10:40SPM: Dynamic AFMNational Harbor 4
Session chair: Liam Collins, Oak Ridge National Laboratory, US
10:40The effects of beam dynamics on Atomic Force Microscopy measurements
R. Wagner, Purdue University, US
11:05Photothermally driven AFM of soft matter samples
P. van Schendel, P. Frederix, H. Gunstheimer, E. Nelson, D. Ziegler, C. Bippes, J. Adams, Nanosurf, CH
11:25Low Frequency Photothermal Excitation of AFM Microcantilevers
A. Deolia, A. Raman, R.B. Wagner, Purdue University, US
1:30SPM: Machine Learning & AutomationNational Harbor 4
Session chair: Greg Haugstad, University of Minnesota, US
1:30Real-Time Physics-Constrained Machine Learning in Multidimensional Atomic Force Microscopy
J.C. Agar, Drexel University, US
1:55A deep learning content-based image retrieval tool for AFM topography maps
B. Rajabifar, 3M, US
2:20Automated and autonomous scanning probe microscopy for understanding and controlling dynamics in ferroelectric materials
R. Vasudevan, B. Smith, A. Khojandi, S.M. Valleti, S. Jesse, Y. Liu, S.V. Kalinin, M. Ziatdinov, Oak Ridge National Laboratory, US
3:00SPM User Facilities Leadership PanelNational Harbor 4
Session chair: G. Haugstad, University of Minnesota, US
Managing an SPM Shared User Facility at MIT
A. Schwartzman, Massachusetts Institute of Technology, US
Panelist
C. Newcomb, Stanford University, US
Panelist
J. Tresback, Harvard University, US
Panelist
L. Collins, Oak Ridge National Laboratory, US

Tuesday June 20

10:30SPM Based Chemical SpectroscopyNational Harbor 4
Session chair: Liang Gong, 3M, US
10:30Exploiting infrared light-matter interactions to explore complex systems at the nanoscale
L. Tetard, University of Central Florida, US
10:55Single electron spectroscopy and ultrafast time resolution by AFM
P. Grutter, McGill University, CA
11:20Elucidation of silk fiber formation by multi-modal SPM
S. Cohen, Weizmann Institute of Science, IL
11:40Infrared correlation nanoscopy with unprecedented spectral coverage
T. Gokus, attocube Systems AG, DE
12:00Correlative Nanoscale Topographical, Mechanical, Electrical and Chemical Property Mapping with Dimension IconIR
C. Li, C. Phillips, Bruker Nano Surfaces and Metrology, US
1:30SPM in Biology & MedicineNational Harbor 4
Session chair: Christina Newcomb, Stanford University, US
1:30Multiplexed nanoscale viscoelastic mapping of melanoma cells as a biomarker of tumor progression and metastasis
A. Cartagena-Rivera, National Institutes of Health (NIH), US
1:55Malaria derived-EVs properties and function studied by Atomic force microscopy (AFM)
I. Rosenhek-Goldian, P.A. Karam, I. Azuri, E. Dekel, M.I. Morandi, S.R. Cohen, N. Regev-Rudzki, Weizmann Institute of Science, IL
2:15Evaluation of FluidFM for genome editing in single cells
S. Patange, S. Maragh, U.S. National Institute of Standards and Technology, US
2:40The Effect of Lipid Bilayer Dehydration on its Physical Properties
N. Kampf, Y. Dong, Y. Schilt, W. Cao, U. Raviv, J. Klein, Weizmann Institute of Science, IL
3:00Elucidating the pH-driven conformational shift of R-bodies, a force generator in bacteria, with in situ AFM
S. Zhang, University of Washington, US

Wednesday June 21

9:00SPM: Nanomechanics & TribologyNational Harbor 4
Session chair: Greg Haugstad, University of Minnesota, US
9:00Contact Resonance AFM using Long, Massive, Flexible Tips
R.C. Tung, N. Zimron-Politi, University of Nevada, Reno, US
9:25In Situ Study of the Pressure-Dependent Lubrication Mechanism of Phosphonium Phosphate Ionic Liquid in Nanoscale Single-Asperity Sliding Contacts
Z. Li, O. Morales-Collazo, J.T. Sadowski, H. Celio, A. Dolocan, J.F. Brennecke, F. Mangolini, The University of Texas at Austin, US
9:50Improved Contact Resonance Atomic Force Microscopy Data Analysis Techniques
N. Zimron-Politi, R.C. Tung, University of Nevada, Reno, US
10:10The influence of nanoscale mechanical property distribution on macroscopic performance of polymer composites
B. Pittenger, S. Osechinskiy, J. Thornton, S. Loire, T. Mueller, Bruker, US
10:30Break
10:40Maximizing information extraction from AFM nanoindentation — Best practices to algorithms
R. Sheridan, C. Brinson, Duke University, US
11:00Force Spectroscopy Measurements with a focus on viscoelasticity and elasticity of SiO2 nanoparticles on etched biotite and muscovite surfaces
11:20Traceability of NIST Reference Cantilever Array for Standard Reference Material 3461
G.A. Shaw, R.S. Gates, W.A. Osborn, M.J. McLean, J.J. Filliben, National Institute of Standards and Technology, US
11:40Strengthening Polylactic Acid by Salification: Surface Characterization Study
J. Schlosser, K. Fouladi, B. Eslami, Widener University, US
1:30SPM: Voltage Modulated SPM ModesNational Harbor 4
Session chair: Jason Kilgore, National Institute of Standards and Technology, US
1:30Using electrostatic force microscopy to investigate localized charges on single-walled carbon nanotubes
E. Christensen, T. Tumiel, M. Amin, T. Krauss, University of Rochester, US
1:50High speed imaging of surface charge dynamics via Spiral Scanning KPFM and Gaussian Process inpainting
M. Checa, Oak Ridge National Laboratory, US
2:10Measurement sensitivity in electrostatic force and force gradient microscopy-based modes
G. Stan, National Institute of Standards and Technology, US
2:30Measuring Dynamics in Energy Materials with Time-Resolved Atomic Force Microscopy
R. Giridharagopal, M.D. Breshears, D.S. Ginger, University of Washington, US
2:50Quantitative Piezoresponse Force Microscopy for Process Optimization of Scandium-doped Aluminum Nitride in Acoustic Resonator RF Filters
B. Ohler, F.T. Limpoco, R. Proksch, Oxford Instruments Asylum Research Inc, US
3:10Exploring Sub-Coercive Field Domain Wall Motion Dynamics with Piezo Response Scanning Oscillator Microscopy
S. Raghuraman, K. Kelley, S. Jesse, Oak Ridge National Laboratory, US
Topics & Application Areas
  • Nanomechanical measurements on soft materials
  • SPM in biology and medicine
  • AI/ML methods for SPM measurement, acquisition, image processing
  • High speed/high resolution SPM
  • Multimodal SPM-based methods
  • Industrial / real world applications
  • SPM for Energy Applications
  • Other
 

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