TechConnect World 2019
Co-Located with Nanotech 2019 SBIR/STTR Spring AI TechConnect
Nanotech 2019
 

Materials Characterization & Imaging

Nanoscale Materials Characterization

Poster/Paper Abstracts due: March 8

Symposium Co-Chairs

Greg  HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Key Speakers

Igor SokolovNovel Multidimensional Imaging of Surfaces with Atomic Force Microscopy.
Igor Sokolov
Professor, Tufts University

Alex NormanNanoscale Characterization Tools and Method Development for New Products and In-Process Monitoring
Alex Norman
Senior Scientific Associate, Ingredion Incorporated

Alan SchwartzmanAlan Schwartzman
Research Scientist
Massachusetts Institute of Technology

Keith BrownKeith Brown
Assistant Professor
Boston University

Scott BartonBreaking the Size Barrier: Advances in Accurate Nano-Particle Sizing and Distributions with Small Angle X-ray Scattering (SAXS)
Scott Barton
Xenocs, France

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Bede PittengerProbing the time-temperature relationship of mechanical properties in polymer composites
Bede Pittenger
Application Scientist, Bruker Nano

Marina S. LeiteNanoimaging dynamic processes in energy materials
Marina S. Leite
Assistant Professor
University of Maryland
Graham Cross Advances in flat punch thin film indentation
Graham Cross
Professor of Physics
Trinity College Dublin, Ireland
Tim WalshQuantifying Electromechanical Sensitivity and Hysteresis with a Metrological Atomic Force Microscope
Tim Walsh
Applications Engineer, Asylum Research

 

This year's symposium will focus on application of nanoscale characterization to a variety of industries. This emphasis includes both areas of new method development as well as industry-specific application where characterization has led to deeper understanding and/or innovation in processes and fundamental sciences.

Submit Your Abstract

Please first review the information for authors — abstract submission guidelines.

 

Topics & Application Areas

  • Characterization & Imaging for Health Care/Biomedical Materials
  • Characterization & Imaging for Food Materials
  • Characterization & Imaging for Photonic Materials & Devices
  • Characterization & Imaging for Pharmaceutical Materials
  • Materials Characterization & Imaging for Energy & Sustainability
  • Materials Characterization & Imaging for Lubricity/Friction Reduction
  • Special Methods Session: Multimodal Scanning Probe Microscopy
  • Innovations in Nanomaterials Characterization
  • Other
 
2019 Sponsors & Partners
2019 Sponsors & Partners