TechConnect World 2019
 

Materials Characterization & Imaging

Nanoscale Materials Characterization

Symposium Co-Chairs

Greg  HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Key Speakers

Igor SokolovNovel Multidimensional Imaging of Surfaces with Atomic Force Microscopy.
Igor Sokolov
Professor, Tufts University

Alex NormanNanoscale Characterization Tools and Method Development for New Products and In-Process Monitoring
Alex Norman
Senior Scientific Associate, Ingredion Incorporated

Alan SchwartzmanAlan Schwartzman
Research Scientist
Massachusetts Institute of Technology

Keith BrownThe Search for Ground Truth: Machine Learning for Mechanical Design
Keith Brown
Assistant Professor, Boston University

Scott BartonBreaking the Size Barrier: Advances in Accurate Nano-Particle Sizing and Distributions with Small Angle X-ray Scattering (SAXS)
Scott Barton
Director of Sales/North America, Xenocs, France

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Bede PittengerProbing the time-temperature relationship of mechanical properties in polymer composites
Bede Pittenger
Application Scientist, Bruker Nano

Tim WalshQuantifying Electromechanical Sensitivity and Hysteresis with a Metrological Atomic Force Microscope
Tim Walsh
Applications Engineer, Asylum Research

Marina S. LeiteNanoimaging dynamic processes in energy materials
Marina S. Leite
Assistant Professor
University of Maryland
Graham Cross Advances in flat punch thin film indentation
Graham Cross
Professor of Physics
Trinity College Dublin, Ireland
 

Symposium Sessions

Monday June 17

10:30Characterization of Food Materials
1:30Nanomechanical Characterization Methods

Tuesday June 18

10:30Frontiers of Characterization
4:00Materials Characterization & Imaging: Posters

Symposium Program

Monday June 17

10:30Characterization of Food Materials201
Session chair: Alex Norman, Ingredion Incorporated, US
10:30Nanoscale Characterization Tools and Method Development for New Products and In-Process Monitoring
A. Norman, Ingredion Inc, US
10:55Characterization of Nanoparticles in Commercial Food Additives
S. Afrin Khan and T.R. Croley, U.S. Food & Drug Administration, US
11:20A SERS-active fiber containing needle for one-step multiphase sample preparation and minimum invasive detection
L. He, University of Massachusetts Amherst, US
11:45Biomimetic Label-Free Sorting and Analysis of Cells Using Weak Molecular Interactions in Microfluidic Devices
M. Austero Kiechel, Ingredion Inc., US
12:10Electrochemical Microbial Sensor - Rapid, Precise and Portable Pathogenic Detection
G. Botte, Center for Electrochemical Engineering Research - Ohio University, US
1:30Nanomechanical Characterization Methods313
Session chair: Greg Haugstad, University of Minnesota, US
1:30Novel Multidimensional Imaging of Surfaces with Atomic Force Microscopy
I. Sokolov, Tufts University, US
1:55"The Last Axis" : Quantifying Electromechanical Sensitivity and Hysteresis with a Metrological Atomic Force Microscope
T. Walsh, A. Labuda, M. Kocun, R. Proksch, Asylum Research, US
2:20Size-Dependent Mechanics of Polymers and the Need for a New Experimental Paradigm
L. Li, N. Alsharif, V. Saygin, K.A. Brown, Boston University, US
2:45Probing the time-temperature relationship of mechanical properties in polymer composites
B. Pittenger, S. Osechinskiy, J. Mosley, S. Loire, T. Mueller, Bruker Nano, US
3:10Challenges for quantitative nanomechanical measurements with AFM
D. Yablon, SurfaceChar LLC, US
3:35Determining Elastic-Plastic Material Properties Using Instrumented Indentation Test and Finite Element Simulation
D.R. Promer, Z.S. Najafabadi, J. Kim, D. Kujawski, Western Michigan University, US
3:55An Accurate and Precise Method to Calibrate Atomic Force Microscope (AFM) Cantilevers
J. Clark, Auburn University, US

Tuesday June 18

10:30Frontiers of Characterization204
Session chair: Keith Brown, Boston University, US
10:30Imaging Perovskites' Dynamic Processes at the Nanoscale
M.S. Leite, University of Maryland, US
10:55Nanomechanical Properties of a Mazed Bicrystal Microstructure
A.F. Schwartzman, Massachusetts Institute of Technology, US
11:20A programmable transmission electron detector for nanomaterials characterization in a scanning electron microscope
J. Holm, B. Caplins, R. Keller, National Institute of Standards and Technology, US
11:40Fast in situ 3D characterization of nano-materials with X-ray full-field nano-tomography: latest developments at the Advanced Photon Source
V. De Andrade, M. Wojcik, A. Deriy, S. Bean, D. Shu, P. KC, F. De Carlo, Argonne National Laboratory, US
12:00Observation of pronounced electron-phonon coupling in a point defect in monolayer WS2 on the single atom scale
K.A. Cochrane, B. Schuler, J-H. Lee, C. Kastl, C. Chen, E. Barnard, E. Wong, F. Ogletree, S. Aloni, A. Schwartzberg, J. Neaton, A. Weber-Bargioni, Lawrence Berkeley National Lab, US
12:20Breaking the Size Barrier: Advances in Accurate Nano-Particle Sizing and Distributions with Small Angle X-ray Scattering (SAXS)
S. Barton, J.-L. Brousseau, Xenocs, US
4:00Materials Characterization & Imaging: PostersHall C
Nanostructured Molybdenum Trioxide Thin Films Prepared by Thermal Evaporation Technique
B.A. Samad, Moncton University, CA
Investigation of photoluminescent properties of luminescent europium(III) complex Eu(IPA)3.dmph
P. Priyanka, S.P. Khatkar, V.B. Taxak, P. Boora, M.D.UNIVERSITY, IN
Characterization of Magnesium Silicide Stannide Powder for use in Selective Laser Melting
R. Gray, S. LeBlanc, The LeBlanc Lab, US
Positron spectroscopy : the route from nondestructive testing to nondestructive ageing metrology
J.-M. Rey, POSITHÔT, FR
Parallel Beam Electron Microscopy, the ZEISS MultiSEM Characterization Paradigm Shift
K. Crosby, A. Eberle, S. Nickell, Carl Zeiss Microscopy, US
A mechanical system for tensile testing of supported films at the nanoscale
M.F. Pantano, G. Speranza, N. M. Pugno, University of Trento, IT
Microscopic Identification of Micro-Fractures and Deterioration In Arid Environments Of Pro-Oxidant Polyethylene (PE) Specimens Utilizing State of The Art Thermal and Morphological Experimental Protocols
S.M. Al-Salem, A.A. Al-Hazza, A.A. Al-Rowaih, A.T. Al-Dhafeeri, Kuwait Institute for Scientific Research, KW
Curvature Change Analysis of SMART Fibers used for Temperature Adaptive Insulation
A. Latulippe, C. Ripa, S. Fossey, C. Drew, H. Sun, University of Massachusetts Lowell, US
Evaluation of systematic modeling uncertainties of clustering from Nanoindentation data using Machine Learning methods
B.R. Becker, U. Hangen, E.D. Hintsala, B. Stadnick , D.D. Stauffer, Bruker Nano Surfaces, US

This year's symposium will focus on application of nanoscale characterization to a variety of industries. This emphasis includes both areas of new method development as well as industry-specific application where characterization has led to deeper understanding and/or innovation in processes and fundamental sciences.

2019 Sponsors & Partners
 

SBIR/STTR Agency Partners:

SBIR/STTR Agency Partners