Nanotech 2022

JUNE 13-15, 2022
WASHINGTON, DC


Materials Characterization & Imaging

Nanoscale Materials Characterization

Submit your Abstract - due December 17

Please first review the information for authors — abstract submission guidelines.

 

Symposium Co-Chairs

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac), University of Minnesota

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Alex NormanAlex Norman
Associate Director of Materials Science
Modern Meadow

2021 Key Speakers

Daniel ForchheimerIntermodulation AFM with machine learning
Daniel Forchheimer
Chief Operating Officer, Intermodulation Products AB, Sweden

Guichan YuDevelopment of innovative X-ray scattering and scanning probe microscopy software for materials imaging
Guichan Yu
Staff Scientist, University of Minnesota

Ron JonesNIST, Neutrons, and Next Gen Product Development
Ron Jones
Director, NIST nSoft Consortium, National Institute of Standards and Technology

Kathleen WeigandtNeutron Imaging and Far-Field Interferometry
Kathleen Weigandt
Scientist, National Institute of Standards and Technology

Aya TakaseX-ray computed tomography for materials characterization: Transformation by machine learning
Aya Takase
Director of X-ray Imaging, Rigaku

Bede PittengerProbing the time-temperature relationship of mechanical properties in polymer composites
Bede Pittenger
Application Scientist, Bruker Nano

Matt CroweAdvanced Analytical Approaches for Research and Development of Plant-Based Food Ingredients
Matt Crowe
Business Scientist, Ingredion

Liang GongNanoscale Chemical Analysis using AFM-IR
Liang Gong
Senior Research Scientist, 3M

Jonathan ShuAnalytical Resources for Industry in an Academic Institution
Jonathan Shu
Associate Director, Cornell Center for Materials Research

Jeffrey ShallenbergerJeffrey Shallenberger
Associate Director
Penn State Materials Characterization Lab

Ishita ChakrabortyUsing machine learning to probe classification and correlation AFM images
Ishita Chakraborty
Mechanical Engineer & Data Scientist, Stress Engineering Services

Greg HaugstadPhysical interpretations of multimodal AFM contrast on soft materials
Greg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac), University of Minnesota

This year's symposium will focus on innovations in nanoscale materials characterization including new method development as well as industry-specific applications. Submissions are also invited for special sessions focused on machine learning for materials characterization and imaging (in conjunction with the AI TechConnect Conference); and on industrial applications of x-ray scattering methods.

 

Topics & Application Areas

  • User facilities for industrial participation
  • Advances in image analysis
  • Characterization of real-world systems
  • Machine learning for Characterization
  • Other
 

Sponsor & Exhibitor Opportunities


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2021 TechConnect Sponsors & Partners
2021 TechConnect Sponsors & Partners